TotalScope
Development and Integration of a Lenseless microLED-Based 3D Displacement Gauge Microscope for IoT-Enhanced Geostructural Monitoring
The project aims to develop an affordable, portable, lensless 3D displacement gauge microscope for geostructural monitoring in critical infrastructures. Utilizing CMOS sensors and microLED technologies, the device will enable near real-time data processing and seamless integration into Industrial Internet of Things (IIoT) systems. It is designed for field surveys and continuous monitoring campaigns to early identify failures and collapse risks by measuring displacements and vibrations at the microscale. The project brings together two European SMEs, experts in the industrialization and commercialization of advanced LEDs and IIoT technologies, respectively, with an academic partner who conceived the device’s foundational concepts.
